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US 2006/0085707 A1Published application
High speed energy conserving scan architecture
AssigneeTexas Instruments Incorporated
InventorsWaheed Khan, Raul Garibay, Denzil Fernandes
Life of this patent
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Abstract
A system comprising a tester and an integrated circuit, where the integrated circuit comprises a flip-flop, the flip-flop coupled to the tester and a circuit logic. The flip-flop comprises a scan input signal and a scan output signal, the signals coupled to the tester. The flip-flop also comprises multiple clock input signals.
Claims27
A system, comprising:
- a tester;
- and
- an integrated circuit comprising a flip-flop, the flip-flop coupled to the tester and a circuit logic;
- wherein the flip-flop comprises a scan input signal and a scan output signal coupled to the tester, and multiple clock input signals.
1 more element
A system-on-chip (“SoC”), comprising:
- a series of flip-flops, at least some of the flip-flops comprising:
- a scan input signal and output signal, each scan output signal directly coupled to the scan input signal of a succeeding flip-flop;
- and
- multiple functional data input signals coupled to a gate logic;
- and
- a circuit logic fixed between a pair of flip-flops.
3 more elements
A flip-flop, comprising:
- a plurality of flip-flop input signals;
- a transmission gate indirectly coupled to the plurality of flip-flop input signals;
- and
- a gate logic between the plurality of input signals and the transmission gate, wherein the gate logic is directly coupled to at least some of the plurality of input signals, and wherein the gate logic is not an inverter.
1 more element
A flip-flop, comprising:
- a shifting logic comprising a plurality of clock input signals;
- wherein a first of the plurality of clock input signals causes a signal to be copied from a first data input signal to a first data output signal;
- and
- wherein a second of the plurality of clock input signals causes a signal to be copied from the first data output signal to a second data output signal.
1 more element
A method, comprising:
- transferring test bits to a series of flip-flops, each flip-flop comprising test input signals and output signals, at least some flip-flop output signals directly connected to succeeding flip-flop input signals;
- and
- enabling the test bits to pass through circuit logic between the flip-flops to produce modified bits.
Dependencies are inferred from the claim text.