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US 2006/0085704 A1Published application
Semi-conductor component, as well as a process for the reading of test data
AssigneeInfineon Technologies AG
InventorRobert Kaiser
Life of this patent
Estimating the term…
Abstract
The invention relates to a semi-conductor component (2a, 2b), and a process for reading test data, whereby the process comprises the steps: (a) Reading test data generated during a semi-conductor component test procedure from at least one test data register (102a) of a semi-conductor component (2a), (b) Storing the test data in at least one useful data memory cell on the semi-conductor component (2a), and (c) Reading the test data from the at least one useful data memory cell.
Claims8
A process for reading test data, comprising:
- reading test data generated during a semi-conductor component test procedure from at least one test data register of a semi-conductor component;
- storing the test data in at least one useful data memory cell provided on the semi-conductor component;
- and
- reading the test data from the at least one useful data memory cell.
1 more element
A semi-conductor component, comprising:
- a plurality of memory cells for storage of useful data;
- at least one test data register for the storage of test data generated during the testing of the semi-conductor component;
- and
- at least one intermediate register provided for buffering the test data stored in the test data register before relaying the test data to at least one of the plurality of memory cells.
1 more element
Dependencies are inferred from the claim text.