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AssigneeAdvantest Corporation
InventorsHideki Tada, Mitsuo Hori, Takahiro Kataoka
Estimating the term…
There is provided a test simulator simulating a test of a semiconductor device, which includes: a test pattern holding means for holding an existing test pattern to be supplied to the semiconductor device; a device output holding means for previously holding an output to be obtained from the semiconductor device when the existing test pattern is supplied; a test pattern generating means for generating a new test pattern to be supplied to the semiconductor device; a test pattern deciding means for deciding whether the new test pattern is equal to the existing test pattern; and a simulation skipping means for skipping at least a part of a simulation test by reading an output from the device output holding means and using the output as an output for the new test pattern without supplying the new test pattern to the semiconductor device when the test patterns are equal to each other.
A test simulator simulating a test of a semiconductor device, comprising:
The test simulation program making a computer function as a test simulator simulating a test of a semiconductor device, the test simulator comprising:
Dependencies are inferred from the claim text.