Correlation of vent tile settings and rack temperatures
AssigneeHewlett-Packard Development Company, L.P.
InventorsCullen Bash, Chandrakant Patel, Ratnesh Sharma, Abdlmonem Beitelmal
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AssigneeHewlett-Packard Development Company, L.P.
InventorsCullen Bash, Chandrakant Patel, Ratnesh Sharma, Abdlmonem Beitelmal
Estimating the term…
In a method for correlating vent tiles with racks based upon vent tile settings and rack inlet temperatures, the vent tiles are set to a first setting, the first vent tile settings are recorded and the temperatures at the inlets of the racks are detected at the first vent tile settings. One of the vent tiles is closed to obtain a second setting, the second vent tile settings are recorded and the temperatures at the inlets of the racks are detected at the second vent tile settings. In addition, the vent tiles and the racks are correlated based upon the settings of the vent tiles and the temperatures detected at the first vent tile settings and the second vent tile settings.
A method for correlating vent tiles with racks based upon vent tile settings and rack inlet temperatures, said method comprising:
A computing device configured to evaluate relationships between vent tiles and racks, said computing device comprising:
A system for evaluating relationships between vent tiles and racks, said system comprising:
A computer readable storage medium on which is embedded one or more computer programs, said one or more computer programs implementing a method of correlating vent tiles with racks based upon vent tile settings and rack inlet temperatures, said one or more computer programs comprising a set of instructions for:
Dependencies are inferred from the claim text.