Optical coupling apparatus for a dual column charged particle beam tool for imaging and forming silicide in a localized manner
AssigneeCredence Systems Corporation
InventorChun-Cheng Tsao
Life of this patent
Estimating the term…
Loading patent…
AssigneeCredence Systems Corporation
InventorChun-Cheng Tsao
Estimating the term…
An optical coupling apparatus for a dual column charged particle beam tool allowing both optical imaging of an area of an integrated circuit, as well as localized heating of the integrated circuit to form silicide. In one embodiment, optical paths from a whitelight source and a laser source are coupled together by way of first and second beam splitters so that a single optical port of the dual column tool may be utilized for both imaging and heating. In another embodiment, a single laser source is employed to provide both illumination for standard microscopy-type imaging, as well as localized heating. In a third embodiment, a single laser source provides heating along with localized illumination for confocal scanning microscopy-type imaging.
A charged particle beam tool having an optical port comprising:
An apparatus for optically coupling a laser source to a dual-column charged particle beam tool having an optical port, the apparatus comprising:
An apparatus for optically coupling a laser source to a dual-column charged particle beam tool, the apparatus comprising:
An apparatus for optically coupling a laser source and a whitelight source to a dual-column charged particle beam tool having an optical port, the apparatus comprising:
An apparatus for optically coupling a laser source to a dual-column charged particle beam tool having an optical port, the apparatus comprising:
An apparatus for optically coupling a laser source to a dual-column charged particle beam tool having an optical port, the apparatus comprising:
Dependencies are inferred from the claim text.