Inversion based stimulus generation for device testing
AssigneeAdvanced Micro Devices, Inc.
InventorsSebastian Ohnewald, Eric Swartzendruber, Kai Eichhorn
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Abstract
A device testing apparatus and method for testing a semiconductor device is provided. For device testing, stimulus data is generated and provided to the semiconductor device, and output data of the semiconductor device is then evaluated to verify proper operation of the semiconductor device. Further, data in the semiconductor device output data space is mapped to stimulus data, and a set of stimulus data is determined based on the mapping results for further testing.
Claims39
A device testing apparatus for testing a semiconductor device, comprising:
- a stimulus generator adapted to generate stimulus data to be provided to said semiconductor device;
- and
- a result evaluator connected to receive output data from said semiconductor device in response to generated stimulus data being provided to said semiconductor device, said result evaluator being adapted to evaluate said output data to verify proper operation of said semiconductor device,
- wherein said device testing apparatus further comprises a backmapping unit adapted to map data in the semiconductor device output data space to stimulus data and determine a set of stimulus data for further testing.
A device testing method for testing a semiconductor device, comprising:
- generating stimulus data;
- providing the generated stimulus data to said semiconductor device;
- and
- evaluating output data of said semiconductor device to verify proper operation of said semiconductor device,
- wherein the method further comprises:
- mapping data in the semiconductor device output data space to stimulus data;
- and
- determining a set of stimulus data based on the mapping results for further testing.
A computer-readable medium having stored thereon instructions that when executed by a processor cause the processor to test a semiconductor device by mapping data in the semiconductor device output data space back to stimulus data, and determining a reduced set of stimulus data for further testing.
Dependencies are inferred from the claim text.