Integrated circuit memory devices that support detection of write errors occuring during power failures and methods of operating same

A method of operating an integrated circuit memory device, comprising the steps of:

• generating first checksum data from first data received by the memory device;
• writing the first data and the first checksum data into a non-volatile memory array within the memory device;
• then
• reading the first data and the first checksum data from the non-volatile memory array;
• generating second checksum data from first data read from the non-volatile memory array;
• and
• comparing the second checksum data against the first checksum data read from the non-volatile memory array to detect differences therebetween.

A method of operating an integrated circuit memory device, comprising the steps of:

• generating first checksum data from first data received by the memory device;
• writing the first data and the first checksum data into a non-volatile memory array within the memory device;
• writing a copy of the first checksum data into another memory array within the memory device;
• then
• reading the first data and the first checksum data from the non-volatile memory array;
• and
• comparing the copy of the first checksum data read from the another memory array against the first checksum data read from the non-volatile memory array to detect differences therebetween.