Defect monitoring system
OwnerMichael Gatov, Deborah Leek +1inventors
InventorsMichael Gatov, Deborah Leek, Bruce Whitefield
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OwnerMichael Gatov, Deborah Leek +1inventors
InventorsMichael Gatov, Deborah Leek, Bruce Whitefield
Estimating the term…
A method of determining a cost effective number of corrective tests to perform on a process experiencing process excursions. A test cost for each corrective test is determined, and a total test cost for each of an incremental number of corrective tests is calculated. An effect of each corrective test on a reduction in the process excursions is determined, as is also the lost revenue for each process excursion. A reduction in the lost revenue for each of the incremental number of corrective tests is calculated, based at least in part on the effect of each corrective test on the reduction in process excursions and the revenue lost for each process excursion. An overall cost for each of the incremental number of corrective tests is calculated, based at least in part on a sum of the total test cost and the reduction in the lost revenue for each of the incremental number of corrective tests. A minimum value of the overall costs is found, and that incremental number of corrective tests that is associated with the minimum value of the overall costs is selected as the cost effective number of corrective tests to perform.
A method of determining a cost effective number of corrective tests to perform on a process experiencing process excursions, the method comprising the steps of:
A method of determining a cost effective number of corrective tests to perform on a process experiencing process excursions, the method comprising the steps of:
A method of determining a cost effective number of corrective tests to perform on a process experiencing process excursions, the method comprising the steps of:
Dependencies are inferred from the claim text.