Emissivity measuring device
AssigneeUbe Industries, Ltd.
InventorsShozo Katsuki, Akira Ohnishi, Sumitaka Tachikawa, Hosei Nagano, Hiroaki Yamana
Life of this patent
Estimating the term…
Loading patent…
AssigneeUbe Industries, Ltd.
InventorsShozo Katsuki, Akira Ohnishi, Sumitaka Tachikawa, Hosei Nagano, Hiroaki Yamana
Estimating the term…
The emissivity measuring device 10 of the present invention includes an integrating sphere 18 having an energy entering hole 12 through which radiation energy is made to enter from an infrared ray source 11, a sample hole 14 placed being opposite to an entering direction of radiation energy supplied from the energy entering hole 12 and open edge portions of which are put into contact, in a struck manner, with an object 13 to be tested, and a detecting hole 16 to which a detector 15 to detect radiation energy is attached, wherein the detector 15 detects radiation energy emitted from the object 13 to be tested being multiple-scattered by the integrating sphere 17 via the detecting hole 16 and the detected radiation energy is compared with a measured value of emissivity of a known sample in a calculation controlling means 18 to calculate emissivity of the object 13 to be tested. The temperature sensor is attached to aperture edge portions of the sample hole 14.
An emissivity measuring device comprising:
Dependencies are inferred from the claim text.