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US 2006/0067152 A1Published application
Crosspoint memory array utilizing one time programmable antifuse cells
AssigneeIntel Corporation
InventorsAli Keshavarzi, Fabrice Paillet, Muhammad Khellah, Dinesh Somasekhar, Yibin Ye, Stephen Tang, Mohsen Alavi, Vivek De
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Abstract
Crosspoint memory arrays utilizing one time programmable antifuse cells are disclosed.
Claims21
A crosspoint memory array comprising:
- one or more row conductors extending in a first direction;
- one or more column conductors extending in a second direction so as to intersect the one or more row conductors;
- and
- an anti-fuse device coupled between a crosspoint formed between a first row conductor and a first column conductor, the anti-fuse device having a gate terminal coupled directly to the first row conductor and a body terminal coupled directly to the first column conductor.
1 more element
A system comprising:
- a bus;
- a network interface coupled to the bus;
- a processor coupled to the bus;
- and
- a memory array coupled to the processor, the memory array including
- one or more row conductors extending in a first direction,
- one or more column conductors extending in a second direction so as to intersect the one or more row conductors, and
- an anti-fuse device coupled between a crosspoint formed between a first row conductor and a first column conductor, the anti-fuse device having a gate terminal coupled directly to the first row conductor and a body terminal coupled directly to the first column conductor.
5 more elements
A method of programming a crosspoint memory array including one or more row conductors and one or more column conductors, the method comprising:
- applying a first programming voltage to a gate of an anti-fuse device coupled directly to a row conductor of the memory array;
- and
- applying a second programming voltage to a body of the anti-fuse device via a column conductor of the memory array;
- the first and second programming voltages selected such that a voltage differential between the gate and the body is sufficient to breakdown a dielectric layer disposed between the gate and the body of the anti-fuse device.
1 more element
Dependencies are inferred from the claim text.