Atom absorption spectroscopy method and atom absorption spectrometer

An atomic absorption spectrometer comprising:

• a source of radiation for generating radiation;
• a device for separating the radiation into a test beam and a reference beam;
• an aperture receptive of the test beam without the reference beam;
• an aperture receptive of the reference beam without the test beam;
• a spectrum analyzer receptive of the test and reference beams from the system of apertures for spectrally isolating a segment of the test and reference beams;
• a detector receptive of the test and reference beams from the spectrum analyzer for detecting the spectrally isolated segment of the test and reference beams.

An atomic absorption spectroscopy method comprising:

• separating quasi-monochromatic radiation into a first test beam and a first reference beam;
• directing the first test beam to a test area wherein the first test beam interacts with an atomized material sample for analysis of the sample;
• spatially segregating the first test beam and the first reference beam
• by directing the first test beam and the first reference beam through spatially segregated apertures;
• varying a dimension of the apertures;
• spectrally isolating a segment of the first test beam;
• spectrally isolating a segment of the first reference beam;
• separating non-monochromatic radiation into a second test beam and a second reference beam;
• directing the second test beam to the test area wherein the second test beam interacts with an atomized material sample for analysis of the sample;
• spatially segregating the second test beam and the second reference beam;
• spectrally isolating a segment of the second test beam;
• and
• spectrally isolating a segment of the second reference beam.

An atomic absorption spectrometer comprising:

• a first radiation source emitting a first beam;
• a second radiation source emitting a second beam;
• a first beam separator for dividing the first beam into a first test beam and a first reference beam;
• first test beam deflector for deflecting the first test beam toward a test slot for detection;
• a first reference beam deflector for deflecting said first reference beam toward a reference slot for detection;
• a second beam separator for dividing the second beam into a second test beam and a second reference beam;
• a second test beam deflector for deflecting the second test beam toward a test slot for detection;
• and
• a second reference beam deflector for deflecting said second reference beam toward a reference slot for detection.