System and method for inspecting a light-management film and method of making the light-management film

A system for inspecting a light-management film, the system comprising:

• a working plate comprising a first plate surface and a second plate surface;
• a backlight source disposed proximate to the second plate surface and in optical communication with the working plate, wherein the backlight source is capable of acting as a transmission light source such that transmission light can be transmitted through the second plate surface to the first plate surface;
• and
• an overhead light source disposed proximate to the first plate surface, wherein the overhead light source and the backlight source are disposed on opposite sides of the working plate, and wherein the overhead light source is capable of acting as a reflective light source such that reflective light can be reflected off the light-management film when the light-management film is disposed in physical communication with the first plate surface.

A method of making a light-management film, the method comprising:

• forming a light-management film comprising light-redirecting structures disposed on a surface of the light-management film;
• inspecting the light-management film, wherein inspecting comprises
• reflecting light from an overhead light source off a first side of the light-management film and examining the light-management film for defects;
• directing transmission light from a backlight source through a second side of the light-management film to the first side and examining the light-management film for defects;
• reflecting light from the overhead light source off the second side of the light-management film and examining the light-management film for defects;
• directing transmission light from the backlight source through the first side of the light-management film to the second side and examining the light-management film for defects;
• and
• measuring a location of each of the examined defects in the light-management film;
• classifying the examined defects;
• comparing the classified defects to a predetermined set of defects to determine the cause of the defects;
• and
• modifying a process condition in the forming of the light-management film based on the comparing of the classified defect to the predetermined set of defects.