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US 2006/0066838 A1Published application
Method and apparatus for determining the nonlinear properties of devices and fibers
AssigneeLucent Technologies Inc.
InventorChristophe Dorrer
Life of this patent
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Abstract
A method and apparatus are provided for measuring samples of the electric field of light propagated through a device under test and determining a nonlinear property of the device, such as self-phase modulation or cross phase modulation, using the measured samples.
Claims12
A method comprising;
- measuring a plurality of samples of the electric field of light before and after propagating the light through a device under test;
- and
- determining a nonlinear property of the device under test using the measured samples.
A method comprising:
- measuring a plurality of samples of the electric field of light propagated through a device under test, wherein the plurality of samples is measured using a plurality of input powers of the light;
- determining a nonlinear property of the device under test using the plurality of measured samples.
An apparatus comprising;
- means for measuring a plurality of samples of the electric field of light before and after propagating the light through a device under test;
- and
- means for determining a nonlinear property of the device under test using the measured samples.
An apparatus comprising:
- means for measuring a plurality of samples of the electric field of light propagated through a device under test, wherein the plurality of samples is measured using a plurality of input powers of the light;
- means for determining a nonlinear property of the device under test using the plurality of measured samples.
Dependencies are inferred from the claim text.