Reverse magnetic reset to screen for weakly pinned heads
AssigneeHitachi Global Storage Technologies Netherlands B.V.
InventorsCiaran Fox, Kenneth Mackay, Vladimir Nikitin
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AssigneeHitachi Global Storage Technologies Netherlands B.V.
InventorsCiaran Fox, Kenneth Mackay, Vladimir Nikitin
Estimating the term…
A method is disclosed for testing pinned layers of magnetic disk drive read heads having at least one pinned layer, where the magnetic orientation of the pinned layers has been set in an initial direction. The method includes applying a large magnetic test field at a reverse canted reset angle. First test responses from the disk drive read heads are then measured in a small magnetic test field. A large magnetic test field is applied at normal canted reset angle. The disk drive heads are then subjected to a full suite of performance tests in a small magnetic test field to verify their acceptability. These second test responses are then compared to the first test responses to identify read heads having weakly pinned layers.
A method for testing pinned layers of a magnetic read head, having at least one pinned layer, where the magnetic orientation of said at least one pinned layer has been set in an initial direction, said method comprising:
A method of fabrication for magnetic read sensors, said method comprising:
Dependencies are inferred from the claim text.