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US 2006/0064890 A1Published application
Scanning unit and position measuring device
AssigneeDr. Johannes Heidenhain GmbH
InventorSebastian Brandl
Life of this patent
Estimating the term…
Abstract
A scanning unit including a support and a scanning plate fastened on the support by a first fastening element and a second fastening element. An eccentric element that can be rotated around a first axis of rotation and causes pivoting of the scanning plate with respect to the support around a second axis of rotation, wherein the first axis of rotation is constituted by the first element and said second axis of rotation is constituted by the second fastening element.
Claims9
A scanning unit, comprising:
- a support;
- a scanning plate fastened on said support by a first fastening element and a second fastening element;
- an eccentric element that can be rotated around a first axis of rotation and causes pivoting of said scanning plate with respect to said support around a second axis of rotation, wherein said first axis of rotation is constituted by said first element and said second axis of rotation is constituted by said second fastening element.
A position measuring device comprising:
- a graduation support supporting a measuring graduation;
- and
- a scanning unit for scanning said measuring graduation, said scanning unit comprising:
- a support;
- a scanning plate fastened on said support by a first fastening element and a second fastening element;
- and
- an eccentric element that can be rotated around a first axis of rotation and causes pivoting of said scanning plate with respect to said support around a second axis of rotation, wherein said first axis of rotation is constituted by said first element and said second axis of rotation is constituted by said second fastening element.
4 more elements
Dependencies are inferred from the claim text.