Beam current measurement
AssigneeKoninklijke Philips Electronics N.V.
InventorsHubertus Cortenraad, Theodoru Van Den Biggelaar
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AssigneeKoninklijke Philips Electronics N.V.
InventorsHubertus Cortenraad, Theodoru Van Den Biggelaar
Estimating the term…
The display apparatus comprises a picture tube (CRT) with an electron gun which generates an electron beam (BB) directed towards a display screen. The electron gun comprises a first and a second electrode (CA, G1). The electron beam (EB) originates from the first electrode (CA). The voltage between the first electrode (CA) and the second electrode ( G1) controls the intensity of the electron beam (EB). A beam current (IB) flows in the first electrode (CA) in response to the electron beam (EB). A (ICA) in the first electrode (CA) is the sum of the beam current (IB) and a current (IC) flowing through a capacitance (CWN) between the first and the second electrode (CA, G1). A compensation circuit (COM) supplies a compensation current (ICO) to the first electrode (CA) to compensate for a capacitive current (IC) through a capacitance (CIN) between the first and the second electrode (CA, G1). A beam current measurement circuit (BMC) measures the total current (IT) which is the sum of the total current in the first electrode (ICA) and the compensation current (ICO).
A display apparatus comprising
A method of measuring a beam current in a display apparatus comprising an electron gun comprising at least a first electrode (CA) and a second electrode (G1), the method comprising
Dependencies are inferred from the claim text.