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US 2006/0041803 A1Published application
Apparatus and method for dynamic in-circuit probing of field programmable gate arrays
AssigneeAgilent Technologies, Inc.
InventorsJoel Woodward, Adrian Hernandez, James Stewart
Life of this patent
Estimating the term…
Abstract
A dynamic probe system for probing a FPGA with at least one core. A trace core is added to the FPGA, the trace core in communication with a plurality of signal banks, each signal bank comprising a plurality of signals in the at least one core. A logic analyzer, in communication with the trace core and selecting the bank of signal to be sent from the trace core to the logic analyzer.
Claims27
A dynamic probe comprising:
- a FPGA with at least one core;
- a trace core included in the FPGA, the trace core in communication with a plurality of signal banks, each signal bank comprising a plurality of signals in the at least one core;
- and
- a logic analyzer, in communication with the trace core and selecting the bank of signal to be sent from the trace core to the logic analyzer.
1 more element
A method of testing an FPGA, the method comprising:
- identifying a plurality of signal banks in the FPGA, each signal bank comprising a plurality of signals obtained from within the FPGA;
- adding a bank multiplexer to the FPGA, the bank multiplexer in communication with a logic analyzer and the plurality of signal banks;
- sending a control signal from the logic analyzer to the bank multiplexer to select one of the signal banks for testing;
- based on the control signal, switching the bank multiplexer to output the selected signal bank;
- and
- analyzing the signals of the selected signal bank on the logic analyzer.
3 more elements
An FPGA comprising:
- a plurality of cores;
- a plurality of debugging pins;
- trace core means connected to a plurality of signal in the FPGA, the trace core means segregating the plurality of signals into a plurality of banks of signals and, based on an instruction originating external to the FPGA, selectively outputting a single bank of signals to the plurality of debugging pins.
Dependencies are inferred from the claim text.