Method for measuring dissociation rate coefficient by surface plasmon resonance analysis
AssigneeFuji Photo Film Co., Ltd.
InventorsHisashi Ohtsuka, Nobuhiko Ogura
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AssigneeFuji Photo Film Co., Ltd.
InventorsHisashi Ohtsuka, Nobuhiko Ogura
Estimating the term…
An object of the present invention is to provide a method for measuring the dissociation rate coefficient (Kd) by surface plasmon resonance analysis without measuring the theoretical maximum amount of binding (Rmax). The present invention provides a method for measuring the dissociation rate coefficient (Kd) of the reaction between an analyte molecule immobilized on a metal surface and a molecule that interacts with the analyte molecule by assaying changes in surface plasmon resonance signals using a surface plasmon resonance measurement device, wherein the signal and the slope of the dissociation curve of the surface plasmon resonance signal curves, or the signal ratio are used to calculate the dissociation rate coefficient (Kd).
A method for measuring the dissociation rate coefficient (Kd) of the reaction between an analyte molecule immobilized on a metal surface and a molecule that interacts with the analyte molecule by assaying changes in surface plasmon resonance signals using a surface plasmon resonance measurement device, wherein the signal and the slope of the dissociation curve of the surface plasmon resonance signal curves, or the signal ratio are used to calculate the dissociation rate coefficient (Kd).
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