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AssigneeFuji Photo Film Co., Ltd.
InventorHisashi Ohtsuka
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An object of the present invention is to provide a method for measuring a rate coefficient by surface plasmon resonance analysis with excellent accuracy, reliability, and cost performance that can improve the assay accuracy and simplify the apparatus. The present invention is provides a method for determining the adsorption rate coefficient (Ka) and the dissociation rate coefficient (Kd) of the reaction between an analyte molecule immobilized on a metal surface and a molecule that interacts with the analyte molecule by measuring changes in surface plasmon resonance signals using a surface plasmon resonance measurement device and performing fitting to a signal curve obtained by such measurement, wherein fitting is performed to the signals from which data obtained at the time of liquid exchange and data obtained at a given time point thereafter have been removed, and that an algorithm is adopted wherein the fitted curve passes through a point representing a baseline value obtained at the time of liquid exchange or immediately therebefore.
A method for determining the adsorption rate coefficient (Ka) and the dissociation rate coefficient (Kd) of the reaction between an analyte molecule immobilized on a metal surface and a molecule that interacts with the analyte molecule by measuring changes in surface plasmon resonance signals using a surface plasmon resonance measurement device and performing fitting to a signal curve obtained by such measurement, wherein fitting is performed to the signals from which data obtained at the time of liquid exchange and data obtained at a given time point thereafter have been removed, and that an algorithm is adopted wherein the fitted curve passes through a point representing a baseline value obtained at the time of liquid exchange or immediately therebefore.
Dependencies are inferred from the claim text.