Measuring apparatus and measuring chip

A measuring chip for use in a measuring apparatus constructed of a light source for emitting a light beam, an optical incidence system for making said light beam enter said dielectric block at an angle of incidence so that a total internal reflection condition is satisfied at an interface between said dielectric block and said thin film layer, and photodetection means for measuring the intensity of said light beam totally reflected at said interface, said measuring chip comprising:

• a dielectric block;
• and
• a thin film layer, formed on a surface of said dielectric block, which is contacted with a sample;
• wherein a plurality of measuring units, which comprise said dielectric block and said thin film, are arranged in a row and integrated;
• wherein
• the dielectreic blocks of said integrated measuring units are discretely formed;
• and
• the discrete dielectric blocks are connected together and integrated by a connecting member.

A measuring chip for use in a measuring apparatus constructed of a light source for emitting a light beam, an optical incidence system for making said light beam enter a dielectric block at an angle of incidence so that total internal reflection conditions are satisfied at an interface between said dielectric block and a thin film layer, and photodetection means for measuring the intensity of said light beam totally reflected at said interface, said measuring chip comprising:

• a plurality of measuring units, each of which comprises said dielectric block, said thin film layer, and a sample holding mechanism for holding a sample on the thin film layer;
• wherein:
• said plurality of measuring units are arranged in a line and integrated;
• and
• each of the sample holding mechanisms of the plurality of measuring units holds a different sample.