Back to results
US 2005/0205779 A1Published application
Scanning systems and methods with time delay sensing
AssigneeOptometrix, Inc.
InventorRobert Falk
Life of this patent
Estimating the term…
Abstract
Methods and systems that excite a test structure with an excitation beam and then sense the response of the test structure after some prescribed time interval with respect to the excitation. One or more detectors detect an emission from the test structure at a location of the test structure that is offset from a position on the test structure that is coincident with the excitation beam as the beam is scanned across the test structure.
Claims17
An imaging apparatus comprising
- an excitation source for generating a excitation beam;
- a scanning device for scanning the excitation beam over a test structure;
- a detection device for detecting an emission from the test structure, said detector device being configured to detect an emission from the test structure at a location of the test structure that is offset from a position on the test structure that is coincident with the excitation beam.
An imaging method comprising
- generating an excitation beam;
- scanning the excitation beam over a test structure;
- detecting an emission from the test structure, said detector device being configured to detect an emission from the test structure at a location of the test structure that is offset from a position on the test structure that is coincident with the excitation beam.
Dependencies are inferred from the claim text.