US 2005/0045977 A1 · REPEATED STRUCTURE OF NANOMETER THIN FILMS WITH SYMMETRIC OR ASYMMETRIC CONFIGURATION FOR SPR SIGNAL MODULATION

Abstract

A symmetric or asymmetric multilayer structure based on the technique of surface plasmon resonance (SPR) has been applied for modulation of resonant angle and wavelength. The fabrication of this invention can have nanoscale thin film layers up to several hundreds, while each layer has its own material of a high or low refractive index value, and the total layers in a thickness of tens to hundreds nanometers are grown in this single structure. This invention is intended for optimizing the scanning of mechanism by modulating SPR resonant angle and wavelength, and for developing the prospect of portable instruments.

Claims27

Dependent claims

An active surface plasmon resonance (SPR) chip, comprising:

a first layer of metal;
an outmost layer of metal;
and
a nanometer multilayer structure having a high refractive index of material and a low refractive index of material to form at least a monolayer structure interposed between said first layer of material and said outmost layer of material such that resonant angle and wavelength occurs through an arrangement of said nanometer multilayer structure.

1 more element

Dependencies are inferred from the claim text.

Repeated structure of nanometer thin films with symmetric or asymmetric configuration for spr signal modulation

Life of this patent

Repeated structure of nanometer thin films with symmetric or asymmetric configuration for spr signal modulation

Life of this patent

Abstract

Claims27