Test emulator, test module emulator, and record medium storing program therein

A record medium storing therein program for causing a computer to function as a test emulator for emulating test apparatuses comprising a plurality of test modules for supplying test signal to devices under test respectively, wherein the program causes the computer to function as:

• a plurality of test module emulation sections for emulating the plurality of test modules generating the test signal based on different cycles;
• a control emulation section for emulating a control apparatus for controlling the test of the devices under test;
• a synchronous emulation section for generating test signal generating timings, at which each of said plurality of test module emulation sections is to generate the test signal in simulation corresponding to cycle time of said test module emulation section, based on instructions from said control emulation section;
• a timing alignment section for aligning the plurality of test signal generating timings generated by said synchronous emulation section in order of time, and outputting them one by one;
• and
• a schedule section for causing said test module emulation section corresponding to one of the test signal generating timings output by said timing alignment section to generate the test signal in simulation in the cycle time corresponding to the test signal generating timing.

A test module emulator for emulating a test module among a plurality of test modules by a test emulator for emulating test apparatuses comprising the plurality of test modules for supplying test signal to devices under test respectively based on a different cycle, wherein the test emulator comprises:

• a control emulation section for emulating a control apparatus for controlling the test of the devices under test;
• a synchronous emulation section for generating test signal generating timings, at which each of said plurality of test module emulation sections is to generate the test signal in simulation corresponding to cycle time of said test module emulation section, based on instructions from said control emulation section;
• a timing alignment section for aligning the plurality of test signal generating timings generated by said synchronous emulation section in order of time, and outputting them one by one;
• and
• a schedule section for causing said test module emulation section corresponding to one of the test signal generating timings output by said timing alignment section to generate the test signal in simulation in the cycle time corresponding to the test signal generating timing, and
• the test module emulator comprises a pattern generator emulation section for generating the test signal in simulation in the cycle time corresponding to one of the test signal generating timings based on instructions from said schedule section.

A record medium storing therein program for causing a computer to function as a test module emulator for emulating a test module among a plurality of test modules as for a test emulator for emulating test apparatuses comprising the plurality of test modules for supplying test signal to devices under test respectively based on a different cycle, wherein the test emulator comprises:

• a control emulation section for emulating a control apparatus for controlling the test of the devices under test;
• a synchronous emulation section for generating test signal generating timings, at which each of said plurality of test module emulation sections is to generate the test signal in simulation corresponding to cycle time of said test module emulation section, based on instructions from said control emulation section;
• a timing alignment section for aligning the plurality of test signal generating timings generated by said synchronous emulation section in order of time, and outputting them one by one;
• and
• a schedule section for causing said test module emulation section corresponding to one of the test signal generating timings output by said timing alignment section to generate the test signal in simulation in the cycle time corresponding to the test signal generating timing, and
• the program causes the computer to function as a pattern generator emulation section for generating the test signal in simulation in the cycle time corresponding to one of the test signal generating timings based on instructions from said schedule section.

A test apparatus comprising a test module for supplying a test signal to a device under test, comprising:

• a control apparatus for controlling a test of the device under test;
• a test module for generating a test signal based on a cycle;
• and
• a test module emulation section for emulating said test module, wherein
• said control apparatus inputs an instruction about which of a real test or a simulation test is to be selected for the test of the device under test,
• said control apparatus supplies said test module with a test program for testing the device under test and causes said test module to test the device under test when the instruction indicates that the real test of the device under test is to be performed, and
• said control apparatus supplies said test module emulation section with a test program for testing the device under test and causes said test module emulation section to simulate the test of the device under test when the instructions indicates that the simulation test of the device under test is to be performed.

A test emulator for emulating a test apparatus comprising a plurality of test modules for supplying a test signal to devices under test, comprising:

• a plurality of test module emulation sections for emulating the plurality of test modules generating the test signal based on a cycle;
• a control emulation section for emulating a control apparatus for controlling the test of the devices under test;
• and
• a schedule section for scheduling test signal generating timing at which each of said plurality of test module emulation sections is to generate test signal corresponding to a cycle time in simulation, wherein
• said test module emulation section outputs variation of voltage of the test signal during the cycle time corresponding to the test signal generating timing by calling voltage setting method of an output channel object which emulates an output channel for multiple times on receiving the test signal generating timing by a function call, and
• said test module emulation section notifies that output of the variation of the voltage of the test signal corresponding to the cycle time is finished by calling an end method of the output channel object output after the output of the variation of the voltage of the test signal corresponding to the cycle time is finished.