Input circuit and method for the operation thereof
AssigneeSiemens Aktiengesellschaft
InventorsStefan Grosser, Mario Maier, Reinhard Mark, Monika Singer
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AssigneeSiemens Aktiengesellschaft
InventorsStefan Grosser, Mario Maier, Reinhard Mark, Monika Singer
Estimating the term…
An input circuit (1′) provided with a time delay element (40), which circuit is capable of being tested by a controlled high level or low level connection, and a method for the operation thereof. The delay time of the time-delay element can be modified during operation of the input circuit. In particular, the elapsed delay time is read out prior to the testing of the input circuit and is restored again after testing, so that the test does not increase the effective input delay time for the process signals. In addition or as an alternative, the delay time is set to a minimum value prior to the test to enable rapid testing of the input circuit independent of the set delay time.
An input circuit comprising:
An input circuit comprising:
A method for operating an input circuit, the input circuit having an input, a voltage divider with a center tap, a time delay element, a control device, and means for the high level and low level connection,
Dependencies are inferred from the claim text.