US 2004/0205437 A1 · System for testing device under test and test method thereof

Abstract

A test system for testing a device under test (DUT) and a test method thereof. At first, an expected test pattern having a test input signal and an expected output signal is output. Next, the expected test pattern is compressed, and an expected compressed pattern having an expected compressed output signal corresponding to the expected output signal is output and saved. Then, the expected compressed pattern is decompressed, and the test input signal is applied to the DUT for testing the DUT. Next, a real output signal output from the DUT is received and compressed, and then a real compressed output signal is output and saved. At last, the real compressed output signal and the expected compressed output signal are compared to determine the test result.

Claims11

Dependent claims

A test method for testing a device under test (DUT), the method comprising the steps of:

outputting an expected test pattern corresponding to the DUT, the expected test pattern having a test input signal and an expected output signal;
compressing the expected test pattern and outputting an expected compressed pattern having an expected compressed output signal corresponding to the expected output signal;
saving the expected compressed pattern;
acquiring and decompressing the expected compressed pattern, and then outputting the test input signal to test the DUT;
receiving and compressing a real output signal output from the DUT, and then outputting a real compressed output signal;
saving the real compressed output signal;
and
judging whether or not the real compressed output signal and the expected compressed output signal are the same.

5 more elements

Dependencies are inferred from the claim text.

System for testing device under test and test method thereof

Life of this patent

System for testing device under test and test method thereof

Life of this patent

Abstract

Claims11