Memory device with sense amplifier and self-timed latch
AssigneeFreescale Semiconductor, Inc.
InventorsJeremiah T. C. Palmer, Perry H. Pelley III
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AssigneeFreescale Semiconductor, Inc.
InventorsJeremiah T. C. Palmer, Perry H. Pelley III
Estimating the term…
A memory device (201) includes a plurality of memory cells (203), bit lines, word lines, a sense amplifier (314), and a self-timed latch (215). The sense amplifier (314), responsive to a sense enable signal, is for sensing and amplifying a voltage on the bit lines corresponding to a stored logic state of a selected one of the plurality of memory cells. An isolation circuit (306, 308) is coupled between the bit lines (205 and 207) and the sense amplifier (314). The isolation circuit (306, 308) is for decoupling the selected one of the plurality of memory cells from the sense amplifier (314) at about the same time that the sense enable signal is asserted. A self-timed latch (215) is coupled to the sense amplifier (314). The self-timed latch (215) does not receive a clock signal and is responsive to only the amplified voltage.
A memory device, comprising:
A memory device comprising:
A method for reading a memory cell of a memory device, the memory device comprising a plurality of memory cells, each of the plurality of memory cells coupled to a bit line and to a word line, the method comprising:
Dependencies are inferred from the claim text.