System, method and product for providing a stable calibration standard for optical systems
AssigneeAffymetrix, Inc. a Corporation Organized under the laws of Delaware
InventorGregory C. Loney
Life of this patent
Estimating the term…
Abstract
A system is described for providing a wavelength of light that comprises: a scanner that provides a first wavelength; and an optical assembly that emits a second wavelength based, at least in part upon the first wavelength, wherein the second wavelength is not the result of a fluorescent emission.
Claims26
A system for providing a wavelength of light, comprising:
- a scanner that provides a first wavelength;
- and
- an optical assembly that emits a second wavelength based, at least in part upon the first wavelength, wherein the second wavelength is not the result of a fluorescent emission.
A method for providing a wavelength of light comprising:
- providing a first wavelength;
- and
- emitting a second wavelength based, at least in part upon the first wavelength, wherein the second wavelength is not the result of a fluorescent emission.
An optical assembly, comprising:
- a detector that detects a first measure of power associated with a first wavelength;
- a control unit that provides a second measure of power proportional to the first measure of power, wherein the second measure of power is associated with a second wavelength;
- and
- a source that emits the second wavelength at the second measure of power.
A method of using an optical assembly, comprising:
- detecting a first measure of power associated with a first wavelength;
- providing a second measure of power proportional to the first measure of power, wherein the second measure of power is associated with a second wavelength;
- and
- emitting the second wavelength at the second measure of power.
A system for calibrating a scanner, comprising:
- a scanner that provides a first wavelength;
- a first detector that detects a first measure of power associated with the first wavelength;
- a control unit that provides a second measure of power proportional to the first measure of power, wherein the second measure of power is associated with a second wavelength;
- a source that emits the second wavelength at the second measure of power;
- a second detector associated with the scanner, wherein the second detector generates a signal based, at least in part, upon the second wavelength and the second measure of power;
- and
- an instrument control application that calibrates the second detector based, at least in part, upon the signal.
A method for calibrating a scanner, comprising:
- providing a first wavelength;
- detecting a first measure of power associated with the first wavelength;
- providing a second measure of power proportional to the first measure of power, wherein the second measure of power is associated with a second wavelength;
- emitting the second wavelength at the second measure of power;
- generating a signal based, at least in part, upon the second wavelength and the second measure of power;
- and
- calibrating the second detector based, at least in part, upon the signal.
A system for calibrating a scanner, comprising:
- a scanner that provides a first wavelength;
- an optical assembly that comprises:
- a first detector that detects a first measure of power associated with the first wavelength;
- a control unit that provides a second measure of power proportional to the first measure of power, wherein the second measure of power is associated with a second wavelength;
- and
- a source that emits the second wavelength at the second measure of power;
- a second detector associated with the scanner, wherein the second detector generates a signal based, at least in part, upon the second wavelength and the second measure of power;
- and
- a computer having system memory with an instrument control application stored thereon, wherein the instrument control application executes the step of:
- calibrating the second detector based, at least in part, upon the signal.
Dependencies are inferred from the claim text.