LCD defect identifying apparatus
OwnerYu-Chou Lee, Ting-Hui Lee +1inventors
InventorsYu-Chou Lee, Ting-Hui Lee, Chen-Hsien Wang
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Abstract
A defect identifying apparatus marks a defect location, obviating manual marking in the LCD manufacturing process. The defect identifying apparatus includes a microscope and a defect marker. The defect marker is fastened to a base of the microscope. The defect marker includes an ink jet and a support frame. The support frame is employed to fix the ink jet to the base of the microscope. The ink jet should be positioned between an objective lens and its focal plane so as to avoid scratching the LCD substrate.
Claims7
A defect identifying apparatus, for inspecting and locating defects on an LCD substrate, said defect identifying apparatus comprising:
- a microscope, including at least one objective lens and a base;
- a defect marker fixed to said base, wherein said defect marker locates a defect.
A defect identifying apparatus, for inspecting and locating defects on an LCD substrate, said defect identifying apparatus comprising:
- an inspection apparatus, including a base;
- a defect marker fixed to said base, said defect marker including an ink jet, wherein said ink jet marks a defect.
Dependencies are inferred from the claim text.