Pattern writing apparatus and pattern writing method
AssigneeDainippon Screen Mfg. Co., Ltd.
InventorHiroyuki Shirota
Life of this patent
Estimating the term…
Loading patent…
AssigneeDainippon Screen Mfg. Co., Ltd.
InventorHiroyuki Shirota
Estimating the term…
A pattern writing apparatus for writing a pattern on a photosensitive material comprises a head provided with a DMD having a micromirror group which modulates reflected light, a stage holding a substrate, and mechanisms for moving the head and the stage relative to each other. In the pattern writing apparatus, for pattern writing, an irradiation region group on a substrate, which corresponds to the micromirror group of the DMD, is scanned in a main scanning direction that is angled relative to the direction of arrangement of the irradiation region group. The irradiation region group is also intermittently moved in the sub-scanning direction by a distance shorter than the width of the irradiation region group in the sub-scanning direction, for pattern writing of the entire substrate. Thus, even with slight changes in an intermittent travel distance (A) of the irradiation region group, light is suitably applied to a region between strips (71, 72), whereby high-precision high-speed pattern writing is achieved.
A pattern writing apparatus for writing a pattern by light irradiation on a photosensitive material, comprising:
A pattern writing method of writing a pattern by light irradiation on a photosensitive material, comprising the steps of:
Dependencies are inferred from the claim text.