System for testing integrated circuit devices

A system comprising:

• an integrated circuit device;
• a voltage producing circuit located within the integrated circuit device to produce a voltage;
• and
• a control circuit coupled to the voltage producing circuit and located within the integrated circuit device to provide a selected one of a plurality of voltage increments with respect to the voltage according to an external signal allowing the control circuit to be controlled externally of the integrated circuit device.

A system enclosed within a package comprising:

• an integrated circuit;
• a voltage generating circuit coupled to the integrated circuit comprising:
• a voltage producing circuit to produce a voltage;
• and
• a voltage regulating circuit coupled to the voltage producing circuit to maintain the voltage at a setpoint value;
• a test mode enabling circuit coupled to the integrated circuit and adapted to cause the integrated circuit to enter a test mode in response to an external signal;
• a test circuit coupled to the voltage generating circuit and adapted to generate test vector signals in response to coded signals generated external of the package, and wherein the test vector signals represent a different incremental adjustments in the voltage;
• and
• a control circuit coupled to the voltage generating circuit and the test circuit to incrementally adjust the voltage into a desired one of a plurality of voltages in response to the test vector signals to provide a plurality of voltages of different magnitudes.

An integrated circuit comprising:

• a memory device;
• a voltage generating circuit coupled to the memory device to produce a voltage at a setpoint value;
• a test mode enable circuit coupled to the voltage generating circuit to cause the integrated circuit device to operate in a test mode in response to coded signals generated externally of the package and applied to signal inputs of the integrated circuit device;
• a test circuit to produce a plurality of test signals coupled to the voltage generating circuit, each of the test signals representing a different voltage magnitude;
• and
• a control circuit coupled to the voltage generating circuit and responsive to the test signals to incrementally adjust the voltage relative to the setpoint value to provide a plurality of test voltages of different magnitudes for testing the memory device.

An integrated circuit comprising:

• a memory device;
• a voltage generating circuit coupled to the memory device comprising:
• a voltage producing circuit to produce a bias voltage;
• and
• a regulating circuit coupled to the voltage producing circuit to maintain the bias voltage at a setpoint value and to incrementally adjust a magnitude of the voltage relative to the setpoint value to provide a plurality of voltages of different magnitudes;
• a test mode enable circuit coupled to the voltage generating circuit to cause the integrated circuit device to operate in a test mode in response to a test signal generated externally of the package and applied to a signal input of the integrated circuit;
• a test circuit to produce a plurality of test signals coupled to the voltage generating circuit, wherein each of the test signals represents a different adjustment value and wherein each test signal is produced in response to an external coded signal;
• and
• a control circuit coupled to the voltage generating circuit and adapted to respond to the test signals to control the regulating circuit as a function of the test signals to incrementally adjust a magnitude of the bias voltage produced by the voltage producing circuit to provide a plurality of voltages of different magnitudes.

An integrated circuit comprising:

• a memory device;
• a voltage generating circuit coupled to the memory device to produce a voltage at a setpoint value and to incrementally adjust a magnitude of the voltage relative to the setpoint value to provide a plurality of voltages of different magnitudes;
• a test mode enable circuit coupled to the voltage generating circuit to cause the integrated circuit device to operate in a test mode in response to coded signals generated externally of the package and applied to signal inputs of the integrated circuit device;
• a test circuit to produce a plurality of test signals coupled to the voltage generating circuit, each of the test signals representing a different value for the voltage to be produced by the voltage generating circuit;
• and
• a control circuit coupled to the voltage generating circuit comprising:
• a first circuit device adapted to respond to a first test signal of the plurality of test signals and cause the voltage generating circuit to adjust the magnitude of the voltage to a first adjusted value;
• and
• a second circuit device adapted to respond to a second test signal of the plurality of test signals and cause the voltage generating circuit to adjust the magnitude of the voltage to a second adjusted value.

A system for testing an integrated circuit device comprising:

• a voltage generating circuit to produce a plurality of test voltages, each of the plurality of test voltages having a different magnitude;
• a test circuit to produce at least one test signal coupled to the voltage generating circuit wherein each of the at least one test signal represents a different voltage to be produced by the voltage generating circuit;
• a control circuit coupled to the voltage generating circuit to incrementally adjust a voltage in response to the at least one test signal;
• and
• a programmable circuit coupled to the control circuit to control the control circuit, and to provide an output signal, wherein the control circuit is adapted to cause the voltage generating circuit to adjust the voltage produced by the voltage generating circuit in response to the output signal.

A system for testing an integrated circuit device comprising:

• a voltage generating circuit to produce a voltage at a setpoint value and to selectively increment a voltage with a plurality of voltage increments with respect to the setpoint value to provide a plurality of test voltages, each of the plurality of test voltages having a different magnitude;
• a test mode enable circuit coupled to the voltage generating circuit to cause the integrated circuit device to enter a test mode on receiving a test signal;
• and
• a test control circuit coupled to the voltage generating circuit to cause the voltage generating circuit to selectively increment the voltage relative to the setpoint value to provide a desired test voltage selected from the plurality of test voltages.

A system for testing an integrated circuit device comprising:

• a voltage generating circuit to produce a voltage at a setpoint value and to selectively increment a voltage with a plurality of voltage increments to provide the plurality of test voltages, each of the plurality of test voltages having a different magnitude;
• a test control circuit coupled to the voltage generating circuit to cause the voltage generating circuit to selectively increment the voltage relative to the setpoint value to provide a desired test voltage selected form the plurality of test voltages;
• and
• a programmable circuit coupled to the voltage generating circuit to modify the setpoint value corresponding to a modify signal.

A system for producing test voltages for use in testing an integrated circuit device comprising:

• an integrated circuit device;
• a voltage producing circuit located within the integrated circuit device to produce a voltage and a plurality of voltage increments with respect to the voltage;
• and
• a control circuit coupled to the voltage producing circuit and located within the integrated circuit device to incrementally adjust the voltage with a selected one of the plurality of voltage increments according to an external signal allowing the control circuit to be controlled externally of the integrated circuit device.

A system for producing test voltages enclosed within a package comprising:

• an integrated circuit;
• a voltage generating circuit coupled to the integrated circuit comprising:
• a voltage producing circuit to produce a voltage;
• and
• a voltage regulating circuit coupled to the voltage producing circuit to maintain the voltage at a setpoint value;
• a test mode enabling circuit coupled to the integrated circuit and adapted to cause the integrated circuit to enter a test mode in response to an external signal;
• a test circuit coupled to the voltage generating circuit to generate test vector signals in response to coded signals generated external of the package, and wherein the test vector signals represent a different incremental adjustments in the voltage;
• and
• a control circuit coupled to the voltage generating circuit to incrementally adjust the voltage in response to the test vector signals for testing the integrated circuit to provide a plurality of voltages of different magnitudes.

A system for producing test voltages in an integrated circuit comprising:

• a memory device;
• a voltage generating circuit coupled to the memory device to produce a voltage at a setpoint value;
• a test mode enable circuit coupled to the voltage generating circuit to cause the integrated circuit device to operate in a test mode in response to coded signals generated externally of the package and applied to signal inputs of the integrated circuit device;
• a test circuit to produce a plurality of test signals coupled to the voltage generating circuit, each of the test signals representing a different value for the voltage to be produced by the voltage generating circuit;
• and
• a control circuit coupled to the voltage generating circuit and adapted to respond to the test signals to incrementally adjust the voltage relative to the setpoint value for testing the memory device to provide a selected one of a plurality of voltages.

A system for producing test voltages for testing an integrated circuit device comprising:

• a voltage generating circuit;
• a test circuit to produce at least one test signal coupled to the voltage generating circuit wherein each of the at least one test signal represents a different voltage to be produced by the voltage generating circuit;
• a control circuit coupled to the voltage generating circuit to incrementally adjust a voltage in response to the at least one test signal to a selected one of a plurality of voltage increments;
• and
• a programmable circuit coupled to the control circuit to control the control circuit, wherein the programmable circuit is adapted to provide an output signal and the control circuit is adapted to cause the voltage generating circuit to adjust the voltage produced by the voltage generating circuit in response to the output signal.

A system for producing test voltages for testing an integrated circuit device comprising:

• a voltage generating circuit to produce a voltage at a setpoint value;
• a test mode enable circuit coupled to the voltage generating circuit to cause the integrated circuit device to enter a test mode on receiving a test signal;
• and
• a test control circuit coupled to the voltage generating circuit to cause the voltage generating circuit to perform a plurality of incremental adjustments to the voltage relative to the setpoint value.

A system for producing test voltages for testing an integrated circuit device comprising:

• a voltage generating circuit to produce a voltage at a setpoint value;
• a test control circuit coupled to the voltage generating circuit to cause the voltage generating circuit to perform a plurality of incremental adjustments to the voltage relative to the setpoint value;
• and
• a programmable circuit coupled to the voltage generating circuit to modify the setpoint value corresponding to a modify signal.