Method and system for improving testability and reducing test time for packaged integrated circuits
OwnerJohn A. Benavidesinventor
Life of this patent
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Abstract
An embodiment of this invention provides a circuit and method for improving testability and reducing test time for packaged integrated circuits. An LED is physically mounted to a test socket. One lead of the LED is electrically connected to a positive voltage through a pin on the socket. The other lead of the LED is electrically connected to a driving device physically located on the packaged IC. A packaged IC is inserted in the socket. The packaged IC runs a self-test on itself. If the self-test is positive, the driving device activates the LED.
Claims29
1) A system for indicating status of an IC self-test comprising:
- a) a socket;
- b) a light source, said light source physically and electrically connected to said socket;
- c) wherein said light source is activated by an IC, said IC being inserted in said socket.
2) A system for indicating status of an IC self-test comprising:
- a) a socket;
- b) a light source, said light source physically mounted to said socket and electrically connected between a first pin and second pin on said socket;
- c) wherein said light source is activated by an IC, said IC being inserted in said socket.
3) A system for indicating status of an IC self-test comprising:
- a) a socket;
- b) a light source, said light source physically mounted to said socket and electrically connected between a first pin and second pin on said socket;
- c) wherein said first pin is connected to a positive voltage and said second pin is connected to a driving device on an IC, said IC being inserted in said socket;
- d) wherein said driving device activates said light source.
8) A system for indicating status of an IC self-test comprising:
- a) a socket;
- b) an audio source, said audio source physically and electrically connected to said socket;
- c) wherein said audio source is activated by an IC, said IC being inserted in said socket.
9) A system for indicating status of an IC self-test comprising:
- a) a socket;
- b) an audio source, said audio source physically mounted to said socket and electrically connected between a first pin and second pin on said socket;
- c) wherein said audio source is activated by an IC, said IC being inserted in said socket.
10) A system for indicating status of an IC self-test comprising:
- a) a socket;
- b) an audio source, said audio source physically mounted to said socket and electrically connected between a first pin and second pin on said socket;
- c) wherein said first pin is connected to a positive voltage and said second pin is connected to a driving device on an IC, said IC being inserted in said socket;
- d) wherein said driving device activates said audio source.
15) A method for indicating status of an IC self-test comprising:
- a) physically mounting a light source to a socket;
- b) electrically connecting said light source between a first pin and a second pin on said socket, said socket being connected to an external tester;
- c) inserting an IC in said socket;
- d) providing a positive voltage to said first pin;
- e) connecting said second pin to a driving device on said IC;
- f) applying a set of signals from said external tester to create said self-test on said IC;
- g) wherein said driving device activates said light source if said self-test does not pass.
20) A method for indicating status of an IC self-test comprising:
- a) physically mounting a light source to a socket;
- b) electrically connecting said light source between a first pin and a second pin on said socket, said socket being connected to an external tester;
- c) inserting an IC in said socket;
- d) providing a positive voltage to said first pin;
- e) connecting said second pin to a driving device on said IC;
- f) applying a set of signals from said external tester to create said self-test on said IC;
- g) wherein said driving device activates said light source if said self-test does pass.
25) A method for indicating status of an IC self-test comprising:
- a) physically mounting an audio source to a socket;
- b) electrically connecting said audio source between a first pin and a second pin on said socket, said socket being connected to an external tester;
- c) inserting an IC in said socket;
- d) providing a positive voltage to said first pin;
- e) connecting said second pin to a driving device on said IC;
- f) applying a set of signals from said external tester to create said self-test on said IC;
- g) wherein said driving device activates said audio source if said self-test does not pass.
27) A method for indicating status of an IC self-test comprising:
- a) physically mounting an audio source to a socket;
- b) electrically connecting said audio source between a first pin and a second pin on said socket, said socket being connected to an external tester;
- c) inserting an IC in said socket;
- d) providing a positive voltage to said first pin;
- e) connecting said second pin to a driving device on said IC;
- f) applying a set of signals from said external tester to create said self-test on said IC;
- g) wherein said driving device activates said audio source if said self-test does pass.
29) A system for indicating status of an IC self-test comprising:
- a) a means for connecting a packaged IC to an external tester;
- b) a means for creating light, said means for creating light physically and electrically connected to said means for connecting a packaged IC to an external tester;
- c) wherein said means for creating light is activated by an IC, said IC being inserted in said means for connecting a packaged IC to an external tester.
Dependencies are inferred from the claim text.