Backflush chamber clean
AssigneeApplied Materials, Inc.
InventorsKeith Harvey, Karthik Janakiraman, Kirby Floyd
Life of this patent
Estimating the term…
Loading patent…
AssigneeApplied Materials, Inc.
InventorsKeith Harvey, Karthik Janakiraman, Kirby Floyd
Estimating the term…
A processing chamber may be effectively cleaned by a remote plasma flowed through the chamber in a direction opposite to the direction of gas flowed during wafer processing. Specifically, the remotely generated plasma may be introduced directly into the chamber through a processing gas exhaust or other port, and then be exhausted from the chamber by traveling through the gas distribution shower head to the foreline. In one embodiment of the present invention, this reverse flow of remote cleaning plasma is maintained for the duration of the chamber cleaning step. In an alternative embodiment, the direction of flow of the remote cleaning plasma through the chamber is alternated between this reverse flow and a conventional forward flow.
A method of cleaning a substrate processing chamber having a gas distribution showerhead adapted to release one or more processing gases into an interior substrate processing region of the chamber during a substrate processing operation, the method comprising:
A method of cleaning a substrate processing chamber comprising:
A method of cleaning a processing chamber comprising:
A method of cleaning a processing chamber comprising flowing a remotely generated cleaning plasma into the processing chamber through other than a gas distribution faceplate ordinarily utilized to flow processing gases into the chamber, such that the flowed plasma avoids a substantial pressure increase associated with flow through the gas distribution faceplate, thereby enhancing a concentration of reactive ionic species available to react with and clean the processing chamber.
A substrate processing system comprising:
A valve network governing flow of a remotely generated plasma to a processing chamber, the valve network comprising:
Dependencies are inferred from the claim text.