Back to results
US 2004/0177303 A1Published application
Analog-hybrid ic test system
OwnerToshiyuki Miurainventor
Life of this patent
Estimating the term…
Abstract
An analog-digital hybrid IC test system which is equipped with a logic test system and an analog test system and controls both of them by a main program, and in which the main program has a pattern generation program for a logic test and a description for generating a control signal for the analog test system is added to part of the pattern generation program.
Claims5
An analog-digital hybrid IC test system which is equipped with a logic test system and an analog test system and controls both of them by a main program, characterized in that:
- said main program includes a pattern generation program;
- and control instructions for generating control signals for said analog system are described in part of said pattern generation program.
Dependencies are inferred from the claim text.