Apparatus with a test interface
OwnerAlexander Sebastian Biewenga, Thomas Franciscus Waayersinventors
Life of this patent
Estimating the term…
Loading patent…
OwnerAlexander Sebastian Biewenga, Thomas Franciscus Waayersinventors
Estimating the term…
Boundary scan test circuits are controlled by a test state machine capable of assuming respective test states successively in successive test clock cycles. A single input of the test signal is normally used to control selection of successive states assumed by the test state machine. The test state machine has a standard state diagram of possible states. Further the test circuit contains a shift register to transport test data. A co-processor state machine is provided, capable of assuming respective co-processor states successively in successive cycles of the test clock. The co-processor state machine, when enabled, starts making transitions from a start state in response to assumption of a predetermined one of the test states by the test state machine. The co-processor states assumed by the co-processor following the start state control successive steps of an operation that uses data output from the scan chain under control of the test state machine and/or produce results read into the scan chain under control of the test state machine following the predetermined state. In an embodiment the co-processor supplies successive control signals to program a non-volatile memory in respective ones of the co-processor states. Programmed data is read from the scan chain in test clock cycles determined by the co-processor state machine.
An apparatus comprising
An integrated circuit comprising
A method of programming a non-volatile memory, the method comprising
Dependencies are inferred from the claim text.