Device and method for testing integrated circuit dice in an integrated circuit module

An integrated circuit die comprising:

• a die connection terminal to receive a first mode initiating signal from circuitry external to the integrated circuit die;
• a function circuit responsive to the first mode initiating signal by entering a first mode and responsive to a second mode initiating signal by entering a second mode;
• a switching circuit connected between the die connection terminal and the function circuit to selectively isolate the function circuit from the die connection terminal and to conduct the first mode initiating signal to the function circuit, the switching circuit comprising a programmable circuit including at least one switching circuit selected from a group comprising a fuse, a transistor, and a flash memory cell;
• and
• an impedance circuit connected to the function circuit to conduct the second mode initiating signal to the function circuit upon the function circuit being isolated from the die connection terminal and to support a voltage differential between the first mode initiating signal at the function circuit and the second mode initiating signal.

An integrated circuit module comprising:

• a first terminal and a second terminal for receiving a first voltage and a second voltage respectively from circuitry external to the integrated circuit module;
• a plurality of integrated circuit dice, each integrated circuit die including:
• an external communication terminal;
• a function circuit coupled to the external communication terminal responsive to the first voltage by entering a first mode and responsive to the second voltage by entering a second mode, the second mode being different than the first mode;
• and
• a switching apparatus connected between the first terminal and the external communication terminal of each integrated circuit die of the plurality of integrated circuit dice to selectively isolate the function circuit from the first terminal and to conduct the first voltage to the function circuit, the switching apparatus comprising a programmable circuit including a programmable element consisting of a fuse, a transistor, and a flash memory cell;
• and
• an impedance apparatus connected between the second terminal and the external communication terminal of each integrated circuit die of the plurality of integrated circuit dice to conduct the second voltage to the function circuit upon isolating the function circuit from the first terminal and to support a voltage differential between the first voltage at the function circuit and the second voltage at the second terminal.

A method for initiating at least a first mode and at least a second mode in a function circuit in each circuit die of one or more integrated circuit dice in an integrated circuit module having a module terminal, the function circuit being of the type to enter the at least a first mode and the at least a second mode in response to receiving respectively a first mode initiate signal and a second mode initiate signal, each integrated circuit die including one or more bond pads connected to circuits for receiving a test mode initiate signal at the module terminal, the method comprising:

• conducting the first mode initiate signal to external communication terminals for receiving the first mode initiate signal and from the external communication terminals to the function circuit for initiating the at least a first mode therein, said conducting the first mode initiate signal at least including connecting the module terminal to the function circuit through one of the external communication terminals for receiving the first mode initiate signal;
• discontinuing conducting the first mode initiate signal to the function circuit using an element;
• and
• conducting the second mode initiate signal to the function circuit for initiating the at least a second mode therein.