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US 2004/0177294 A1Published application
Integrated circuit with test signal routing module
AssigneeAvago Technologies General IP (Singapore) Pte. Ltd.
InventorWalter Lee McNall
Life of this patent
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Abstract
Embodiments of the present invention provide an integrated circuit. In one embodiment, the integrated circuit comprises logic blocks and a routing module. The routing module is configured to receive test input vectors, select at least one logic block, select a routing configuration, and route the test input vectors to the at least one selected logic block and provide test output vectors according to the selected routing configuration.
Claims20
An integrated circuit, comprising:
- logic blocks;
- and
- a routing module configured to receive test input vectors, select at least one logic block, select a routing configuration, and route the test input vectors to the at least one selected logic block and provide test output vectors according to the selected routing configuration.
A testing mechanism in an integrated circuit, comprising:
- scan storage elements combined to form scan chains in logic blocks;
- and
- a routing module configured to receive test configuration signals, and select at least one logic block and a routing configuration based on the test configuration signals.
A method of testing an integrated circuit, comprising:
- receiving test input vectors;
- selecting at least one logic block;
- selecting a routing configuration;
- routing the test input vectors to the at least one selected logic block;
- and
- providing test output vectors according to the selected routing configuration.
3 more elements
Dependencies are inferred from the claim text.