Method, system, and product for determining loop inductance of an entire integrated circuit package

A method for determining an inductance of an entire integrated circuit package, said method comprising the steps of:

• generating a shapes description of said entire integrated circuit package;
• generating an extracted model of said entire integrated circuit package utilizing said shapes description;
• simulating said extracted model to product a waveform;
• determining a time constant utilizing said waveform;
• and
• determining an inductance of said entire package utilizing said time constant.

A system for determining an inductance of an entire integrated circuit package, said system comprising:

• generating means for generating a model of said entire integrated circuit package having a first port and a second port;
• said first port being coupled to an energy source and a resistor;
• said second port being shorted;
• simulating means for simulating said package by exciting said first port of said model utilizing said energy source and measuring a voltage at said first port in order to produce a waveform;
• determining means for determining a time constant utilizing said waveform;
• and
• determining means for determining an inductance of said entire integrated circuit package from said first port with respect to said second port utilizing said resistance and said time constant.

A computer program product for determining an inductance of an entire integrated circuit package, said product comprising:

• instruction means for generating a model of said entire integrated circuit package having a first port and a second port;
• said first port being coupled to an energy source and a resistor;
• said second port being shorted;
• instruction means for simulating said package by exciting said first port of said model utilizing said energy source and measuring a voltage at said first port in order to produce a waveform;
• instruction means for determining a time constant utilizing said waveform;
• and
• instruction means for determining an inductance of said entire integrated circuit package from said first port with respect to said second port utilizing said resistance and said time constant.