Systems and methods for detecting defects in printed solder paste
AssigneeSpeedline Technologies, Inc.
InventorDavid P. Prince
Life of this patent
Estimating the term…
Abstract
A method of analyzing an image of a substance deposited onto a substrate, the image comprising a plurality of pixels, includes defining a region of interest in the image, associating the region of interest with first and second perpendicular axis, wherein a set of pixels in the image lie along the first axis, converting the pixels in the region of interest to a single dimensional array aligned with the first axis and projecting along the second axis, and applying at least one threshold to the single dimensional array, the threshold based at least in part on a predetermined limit.
Claims33
A method of analyzing an image of a substance deposited onto a substrate, the image comprising a plurality of pixels, the method comprising:
- defining a region of interest in the image;
- associating the region of interest with first and second perpendicular axis, wherein a set of pixels in the image lie along the first axis;
- converting the pixels in the region of interest to a single dimensional array aligned with the first axis and projecting along the second axis;
- and
- applying at least one threshold to the single dimensional array, the threshold based at least in part on a predetermined limit.
A method of inspecting a substrate having a substance deposited thereon comprising the steps of:
- depositing the substance onto the substrate;
- capturing an image of the substrate;
- detecting variations in texture in the image to determine a location of the substance on the substrate;
- defining a region of interest in the image, the defined region of interest having a first axis, wherein a set of pixels in the image lie along the axis;
- computing, for each pixel along the axis, a sum of all the pixels in the region of interest that are in perpendicular alignment with the respective pixel along the axis;
- representing the sums of each pixel along the axis as a single dimensional array perpendicular to the axis;
- and
- evaluating the single dimensional array to determine whether any features exist in the region of interest.
A system for dispensing solder paste at a predetermined location on a substrate comprising:
- a dispenser that dispenses material on the substrate;
- a controller for maintaining the operations of the dispenser;
- and
- a processor in electrical communication with the controller, the processor being programmed to:
- perform texture-based recognition of a solder paste deposit located on the substrate,
- define a region of interest within the image of solder paste, the defined region of interest having a first axis, wherein a set of pixels in the image lie along the axis;
- compute, for each pixel along the axis, a sum of all the pixels in the region of interest that are in perpendicular alignment with the respective pixel along the axis;
- represent the sums of each pixel along the axis as a single dimensional array perpendicular to the axis;
- and
- evaluate the single dimensional array to determine whether any defects exist in the region of interest.
A method of detecting a defect in a substance deposited on a substrate, comprising:
- capturing an image of the substrate;
- detecting variations in texture in the image to determine a location of the substance on the substrate;
- defining a region of interest in the image, the defined region of interest having a first axis, wherein a set of pixels in the image lie along the axis;
- computing, for each pixel along the axis, a sum of all the pixels in the region of interest that are in perpendicular alignment with the respective pixel along the axis;
- representing the sums of each pixel along the axis as a single dimensional array perpendicular to the axis;
- and
- evaluating the single dimensional array to determine whether any defects exist in the region of interest.
Dependencies are inferred from the claim text.