X-ray diffraction-based scanning system
AssigneeVarian Medical Systems Technologies, Inc.
InventorMichael C. Green
Life of this patent
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Abstract
An x-ray diffraction-based scanning method and system are described. The method includes screening for a particular substance in a container at a transportation center using a flat panel detector having a photoconductor x-ray conversion layer to detect x-rays diffracted by a particular substance in the container. The diffracted x-rays may be characterized in different ways, for examples, by wavelength dispersive diffraction and energy dispersive diffraction.
Claims69
An x-ray scanning system, comprising:
- a conveyor;
- an x-ray source configured to generate x-rays toward the conveyor;
- and
- a flat panel detector coupled to receive diffracted x-rays from a container moving on the conveyor through the x-rays.
A method of container screening, comprising:
- providing a flat panel detector having a photoconductor x-ray conversion layer;
- and
- screening for a particular substance in a container at a transportation center using the flat panel detector.
An x-ray scanning system, comprising:
- a two dimensional amorphous flat panel detector array;
- and
- means for detecting a particular substance in a container at a transportation center using the two dimensional amorphous flat panel detector array.
An x-ray scanning system, comprising:
- an x-ray source;
- and
- means for increasing available power input to an x-ray source when the x-ray source is operating at less than 100% duty cycle.
An x-ray scanning system, comprising:
- a conveyor;
- an x-ray source configured to generate x-rays toward the conveyor, wherein the x-ray source generates an x-ray sheet beam;
- and
- a detector coupled to receive diffracted x-rays from a container moving on the conveyor through the x-rays.
A flat panel detector, comprising:
- a substrate;
- an amplifier layer disposed above the substrate;
- an electrode layer disposed above the amplifier layer;
- a conversion layer disposed above the electrode layer.
An x-ray diffraction scanning system, comprising:
- a flat panel detector, comprising:
- a semiconductor layer;
- a first set of conducting lines coupled to the semiconductor layer;
- and
- a second set of conduction lines coupled to the semiconductor layer;
- a pulse measurement circuit coupled to the first and second set of conducting lines.
Dependencies are inferred from the claim text.