Electron microscope and method for controlling focus position thereof

An electron microscope comprising:

• an electron optical system for conducting an electron beam to a sample;
• an astigmatism control part for controlling astigmatism of said electron optical system with respect to said sample;
• an image detecting part for detecting an image caused by said electron beam aimed at said sample;
• first operating means for spatial frequency changing each of first and second images, which are detected by said image detecting part at two astigmatism quantity of a first astigmatism quantity and a second astigmatism quantity which is an astigmatism quantity shifted from said first astigmatism quantity and which is realized by changing a predetermined physical quantity by a known quantity, to obtain first and second transformed images to mutually divide said first and second transformed images on a spatial frequency plane to derive a measured divided quantity indicative of divided results as a function of a spatial frequency;
• divided quantity data previously prepared as a function of astigmatism quantities and spatial frequencies as a set of theoretical divided quantities, said theoretical divided quantities being obtained by deriving an image transfer function with respect to said electron optical system as a function of astigmatism quantities and spatial frequencies, substituting said two physical quantities, which are shifted from each other by said known quantity, for said image transfer function to obtain first and second transfer function values to mutually divide said first and second transfer function values on a spatial frequency plane;
• and
• second operating means for making a reference to said divided quantity data to derive said theoretical divided quantities, wherein functional characteristics with respect to a spatial frequency correlate to said measured divided quantity, and for deriving an astigmatism quantity corresponding to the derived theoretical divided quantity as said first astigmatism quantity,
• wherein the astigmatism quantity of said electron optical system is controlled by said astigmatism control part on the basis of the operated results of said second operating means.

A method for controlling a focus position of an electron microscope, said method comprising:

• a step of conducting an electron beam to a sample;
• a first operating step of spatial frequency changing each of first and second images, which are detected by an image detecting part at two focus positions of a first focus position and a second focus position, which is a focus shifted from said first focus position and which is realized by changing a predetermined physical quantity by a known quantity, to obtain first and second transformed images to mutually divide said first and second transformed images on a spatial frequency plane to derive a measured divided quantity indicative of divided results as a function of a spatial frequency, when an image caused by said electron beam aimed at said sample is detected by said image detecting part;
• a second operating step of deriving an image transfer function with respect to said electron optical system as a function of a focus position and a spatial frequency, to substitute said two physical quantities, which are shifted from each other by said known quantity, for said image transfer function to obtain first and second transfer function values to mutually divide said first and second transfer function values on a spatial frequency plane, to obtain theoretical divided quantities to make a reference to divided quantity data, which are previously prepared as a function of a focus position and a spatial frequency as a set of said theoretical divided quantities, to derive a focus position corresponding to the derived theoretical divided quantities as said first focus position;
• and
• a step of controlling the focus position of said electron optical system by a focus control part, which is provided for controlling the focus position of said electron optical system with respect to said sample, on the basis of the results of operation at said second operating step.

A method for controlling an astigmatism quantity of an electron microscope, said method comprising:

• a step of conducting an electron beam to a sample;
• a first operating step of spatial-frequency-changing each of first and second images, which are detected by an image detecting part at two astigmatism quantities of a first astigmatism quantity and a second astigmatism quantity, which is an astigmatism quantity shifted from said first astigmatism quantity and which is realized by changing a predetermined physical quantity by a known quantity, to obtain first and second transformed images to mutually divide said first and second transformed images on a spatial frequency plane to derive a measured divided quantity indicative of divided results as a function of a spatial frequency, when an image caused by said electron beam aimed at said sample is detected by said image detecting part;
• a second operating step of deriving an image transfer function with respect to said electron optical system as a function of an astigmatism quantity and a spatial frequency, to substitute said two physical quantities, which are shifted from each other by said known quantity, for said image transfer function to obtain first and second transfer function values to mutually divide said first and second transfer function values on a spatial frequency plane, to obtain theoretical divided quantities to make a reference to divided quantity data, which are previously prepared as a function of an astigmatism quantity and a spatial frequency as a set of said theoretical divided quantities, to derive an astigmatism quantity corresponding to the derived theoretical divided quantities as said first astigmatism quantity;
• and
• a step of controlling the astigmatism quantity of said electron optical system by a focus control part, which is provided for controlling the astigmatism quantity of said electron optical system with respect to said sample, on the basis of the results of operation at said second operating step.