Optical arrangement and scan microscope
AssigneeLeica Microsystems Heidelberg GmbH
InventorHolger Birk
Life of this patent
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Abstract
The invention relates to an optical arrangement for spatially separating an illumination light beam (11) and a detection light beam (29) with an acousto-optical component (13). The arrangement is characterized in that a compensation element (31) is provided that, in a single passage, compensates for a splitting of the detection light beam (29) caused by the acousto-optical component (13) due to double refraction. The invention also relates to a scan microscope comprising an acousto-optical component (13) and a compensation element (31).
Claims16
An optical arrangement for spatially separating an illumination light beam (11) and a detection light beam (29), with an acousto-optical component (13), characterized in that a compensation element (31) is provided that, with a single passage, compensates for a splitting of the detection light beam (29) caused by the acousto-optical component (13) due to birefringence.
A scanning microscope having a light source that generates an illumination light beam (11) and having a detector (39) that picks up a detection light beam (29) coming from by a specimen, and also having an acousto-optical component (13) for spatially separating the illumination light beam (11) and the detection light beam (29), characterized in that, with a single passage, a compensation element (31) compensates for a splitting of the detection light beam (29) caused by the acousto-optical component (13) due to birefringence.
Dependencies are inferred from the claim text.