Moire deflectometer including non-mechanical transparent, spatial light modulators for demonstrating two-axis rulings
AssigneeLSA, Inc.
InventorsDale R. Tyczka, John G. Lehman JR., Alvin B. Cabato
Life of this patent
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Abstract
A Moiré deflectometer includes at least three non-mechanical, transparent, spatial light modulators for demonstrating two sets of patterns on two parallel planes on two of the modulators thereby creating a moiré fringe pattern and a method for using the same. More particularly, each of the spatial light modulators may be a liquid crystal display, an electrochromic device, a micromirror array, a microlouvre array, an electro-optic device, or a holographic device.
Claims27
A Moiré deflectometer comprising:
- at least three non-mechanical, transparent, spatial light modulators two of which to be selected to demonstrate two sets of parallel lines on one corresponding plane therein so as to create a moiré fringe pattern.
A Moiré deflectometery non-mechanical, transparent, spatial light modulator demonstrating at least one checkerboard pattern or a pattern including a plurality of orthogonal parabolas on a corresponding plane therein.
A Moiré deflectometer comprising at least one checkerboard pattern demonstrated on one corresponding plane in at least one non-mechanical, transparent, spatial light modulator so as to create a Moiré fringe pattern.
A Moiré deflectometer non-mechanical, transparent, spatial light modulator demonstrating at least two sets of parallel lines each set on a corresponding plane therein.
A method for measuring a surface contour or a phase-shifting character of an object providing at least three non-mechanical, transparent, spatial light modulators;
- selectively demonstrating two sets of parallel lines in two of said spatial light modulators respectively on one corresponding plane therein, said planes are parallel to each other;
- projecting light onto the object;
- guiding a reflected light reflected by a surface of the object or a mirror behind the object toward the planes;
- detecting a Moiré pattern behind said spatial light modulators;
- and comparing a pattern demonstrated on said SLM the Moiré pattern to determine the surface contour or the phase-shifting character of the object.
A method for measuring a surface contour or a phase-shifting character of an object providing one non-mechanical, transparent, spatial light modulator;
- demonstrating at least two sets of parallel lines in said spatial light modulator on two corresponding planes therein, said planes are parallel to each other;
- projecting light onto the object;
- guiding a reflected light reflected by a surface of the object or a mirror behind the object toward the planes;
- detecting a Moiré pattern behind said spatial light modulator;
- and comparing a pattern demonstrated on said SLM with the Moiré pattern to determine the surface contour or the phase-shifting character of the object.
Dependencies are inferred from the claim text.