Resist compositions
AssigneeWako Pure Chemical Industries, Ltd.
InventorsTsuneaki Maesawa, Fumiyoshi Urano
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AssigneeWako Pure Chemical Industries, Ltd.
InventorsTsuneaki Maesawa, Fumiyoshi Urano
Estimating the term…
The present invention relates to a resist composition for practical use with high resolution, high sensitivity, superior pattern profile and no outgass in energy irradiation under high vacuum, suitable to an ultra-fine processing technology represented by use of electron beam and the like, and provides: (1) a resist composition comprising at least one kind of polymer containing, as components thereof, a monomer unit represented by the following general formula [1]: 1 a monomer unit represented by the following general formula [2]: 2 and a monomer unit represented by the following general formula [3]: 3 at least one kind of compound to generate an acid by irradiation of radioactive ray, represented by the following general formula [4]; an organic basic compound; and a solvent, (2) the resist composition in accordance with (1), further containing a polymer unit represented by the following general formula [13]: 4 and, (3) the resist composition in accordance with (1) and (2), further containing a compound represented by the following general formula [4]: 5 as a compound to generate an acid by irradiation of radioactive ray.
A resist composition comprising:
Dependencies are inferred from the claim text.