Methods and apparatus for testing optical and electrical components
OwnerJulia Y. Larikova, Yajun Wanginventors
Life of this patent
Estimating the term…
Abstract
A method for testing a test component connected to a high-speed electrical component includes connecting a golden optical component to a high-frequency probe, connecting the high-frequency probe to the high-speed electrical component, operating the test component in an application environment to cause a transmission of a high-speed electrical signal from the high-speed electrical component to the golden optical component, and determining if the golden optical component responds to the high-speed electrical signal.
Claims20
An apparatus for testing in an application environment, comprising:
- a high-frequency probe;
- and
- a holder adapted to removably connect an optical component to the high-frequency probe and adapted to removably connect the high-frequency probe to an application substrate.
A method for testing an optical component, comprising:
- connecting the optical component to a high-frequency probe;
- connecting the high-frequency probe to a golden high-speed electrical component;
- transmitting a high-speed electrical signal from the golden high-speed electrical component to the optical component;
- and
- identifying a response by the optical component to the high-speed electrical signal.
A method for testing a test component connected to a high-speed electrical component, comprising:
- connecting a golden optical component to a high-frequency probe;
- connecting the high-frequency probe to the high-speed electrical component;
- operating the test component in an application environment to cause a transmission of a high-speed electrical signal from the high-speed electrical component to the golden optical component;
- and
- determining if the golden optical component responds to the high-speed electrical signal.
A method for testing a test component connected to a high-speed electrical component, comprising:
- connecting a golden optical component to a high-frequency probe;
- connecting the high-frequency probe to the high-speed electrical component;
- transmitting a high-speed electrical signal from the golden optical component to the high-speed electrical component;
- and
- identifying a response by the test component.
Dependencies are inferred from the claim text.