Internal eddy current inspection
AssigneeGeneral Electric Company
InventorsMichael Wayne Fields, Michael Leonard Dziech, Jon Russel Dierdorf, Anthony William Mellors, James Michael Johnson
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Abstract
An eddy current inspection apparatus includes a holder for a specimen, a holder for an eddy current probe, and an eddy current instrument operatively joined thereto. The probe holder includes carriages for translating the probe along first and second axes. The probe holder is selectively moved to align the probe with an internal channel of the specimen for sliding movement therealong to conduct eddy current inspection thereof.
Claims20
An apparatus for eddy current inspection of an internal channel in a specimen, comprising:
- a specimen holder including a releasable bar clamp for releasably mounting said specimen;
- an eddy current probe;
- a probe holder including a collet mounting said probe in a predetermined rotary position;
- upper and lower carriages supporting said probe holder for translation along a first axis to align said probe with said specimen channel, and along a second axis to move said probe inside said channel;
- and
- an eddy current instrument operatively joined to said probe for conducting eddy current inspection of said specimen channel.
A method for eddy current inspection of first and second internal channels in a specimen, comprising:
- fixedly mounting said specimen;
- mounting an eddy current probe for translation along first and second axes relative to said mounted specimen;
- indexing said probe along said first axis to align said probe with said first channel in said specimen;
- sliding said probe inside said first channel along said second axis;
- operating said eddy current probe to inspect said first channel as said probe slides therealong:
- retracting said probe from said first channel;
- indexing said probe along said first axis to align said probe with said second channel in said specimen;
- sliding said probe inside said second channel along said second axis;
- and
- operating said probe to inspect said second channel as said probe slides therealong.
A method for eddy current inspection of an internal channel in a specimen, comprising:
- fixedly mounting said specimen;
- mounting an eddy current probe for translation along first and second axes relative to said mounted specimen;
- indexing said probe along said first axis to align said probe with said internal channel in said specimen;
- sliding said probe inside said specimen channel along said second axis;
- and
- operating said eddy current probe to inspect said channel as said probe slides therealong.
An apparatus for eddy current inspection of an internal channel in a specimen, comprising:
- means for fixedly mounting said specimen;
- an eddy current probe;
- means for mounting said probe for translation along first and second axes relative to said mounted specimen;
- means for indexing said probe said first axis to align said probe with said internal channel in said specimen;
- means for sliding said probe inside said specimen channel along said second axis;
- and
- means for operating said probe to conduct eddy current inspection of said channel as said probe slides therealong.
Dependencies are inferred from the claim text.