Method for analyzing organic material per microscopic area, and device for analysis per microscopic area

Abstract

Provided is a method for evaluating an organic material in the order of nanometers. According to the present invention, suggested are a device and a method for evaluating an organic material in the order of nanometers, which have not been established in the prior art. In particular, information on energy in transition processes between electron energy levels in an organic material can be obtained with a spatial resolution power of several nanometers or less from the surface direction thereof or the cross-sectional direction thereof. The present invention can also be applied to evaluation of the interface state generated when different materials are jointed to each other. For example, the gradient of the potential or the electric charge state in the interface between an electrode and an organic layer in a semiconductor organic material or an organic luminous device can be evaluated. On the basis of the results, a band diagram of this element can be prepared. Consequently, in the element, the expression of a very high function can be realized.

Dependencies are inferred from the claim text.