Electromigration risk analysis in integrated circuit power interconnect systems using pseudo dynamic simulation

A method of predicting whether a power interconnect system of an integrated circuit complies with an electromigration rule, the method comprising:

• modifying a netlist of an integrated circuit so that inputs of transistors in the netlist are configured to receive a common signal;
• determining currents drawn from a power interconnect system upon application of the common signal;
• calculating predicted current densities from the determined currents for at least one location of the power interconnect system;
• and
• comparing one or more of the predicted current densities to an electromigration rule.

An apparatus for predicting a current density distribution of a power interconnect system of an integrated circuit design, said apparatus comprising:

• means for transforming a netlist of an integrated circuit design so that gates of transistors in the netlist are configured to receive a common signal;
• means for simulating the transformed netlist using the common signal to predict currents drawn from a power interconnect system of the integrated circuit;
• means for determining a predicted current density distribution of the power interconnect system;
• and
• means for comparing one or more predicted current densities of the predicted current density distribution to a maximum allowable current density.

An apparatus for predicting whether a power interconnect system of an integrated circuit complies with an electromigration rule, said apparatus comprising:

• means for modifying a netlist of an integrated circuit so that inputs of transistors in the netlist are configured to receive a common signal;
• means for determining currents drawn from a power interconnect system upon application of the common signal;
• means for calculating predicted current densities from the determined currents for at least one location of the power interconnect system;
• and
• means for comparing one or more of the predicted current densities to an electromigration rule.

A computer readable medium having processor readable code for directing one or more processors to perform a method of predicting a current density distribution of a power interconnect system of an integrated circuit design, the method comprising:

• transforming a netlist of an integrated circuit design so that gates of transistors in the netlist are configured to receive a common signal;
• simulating the transformed netlist using the common signal to predict currents drawn from a power interconnect system of the integrated circuit;
• determining a predicted current density distribution of the power interconnect system;
• and
• comparing one or more predicted current densities of the predicted current density distribution to a maximum allowable current density.

A computer readable medium having processor readable code for directing one or more processors to perform a method of predicting whether a power interconnect system of an integrated circuit complies with an electromigration rule, the method comprising:

• modifying a netlist of an integrated circuit so that inputs of transistors in the netlist are configured to receive a common signal;
• determining currents drawn from a power interconnect system upon application of the common signal;
• calculating predicted current densities from the determined currents for at least one location of the power interconnect system;
• and
• comparing one or more of the predicted current densities to an electromigration rule.