Examination system and examination method
AssigneeCarl-Zeiss-Stiftung trading as Carl Zeiss
InventorMichael Haisch
Life of this patent
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Abstract
An examination system and a corresponding examination method, comprise: Arranging a tissue region in a vicinity of an object plane of a microscope and generating an optical image of the tissue region, receiving tissue data from a measuring head separate from the microscope, discriminating the tissue data into at least two data categories and displaying markings in the optical image of the tissue region in dependence of the discriminated data category and a relative position between a component of the microscope and the measuring head.
Claims17
An examination system for displaying a tissue region to be examined to a viewer, the system comprising:
- an optical system for generating an optical image of the tissue region;
- a tissue qualifying system having a measuring head for obtaining tissue data, wherein the measuring head is movable relative to a component of the optical system, the tissue qualifying system further having a computer for analyzing the obtained tissue data and discriminating the obtained tissue data into at least two data categories;
- a position detecting system configured to determine a position of the measuring head relative to the component of the optical system;
- and
- an indicating system for optically marking portions of the optical image of the tissue region based on the detected position of the measuring head and on the discriminated data category.
A method of displaying a tissue region, the method comprising:
- arranging the tissue region in a vicinity of an object plane of an optical system and generating an optical image of the tissue region;
- receiving tissue data from a measuring head which is separate from the optical system and which is movable relative to the optical head;
- discriminating the tissue data into at least two data categories;
- and
- displaying markings in the optical image of the tissue region based on the discriminated data category and a relative position of the measuring head relative to a component of the optical system.
Dependencies are inferred from the claim text.