Method and apparatus for producing an electrical property image of substantially homogeneous objects containing inhomogeneities
AssigneeWiSys Technology Foundation, Inc.
InventorsChristopher William Gregory, William D. Gregory
Life of this patent
Estimating the term…
Abstract
An electrical parameter imaging apparatus and method includes the acquisition of a charge distribution pattern on an array of electrodes that surround an object being imaged. In addition the exterior boundary, or contours of the object is measured by an array of light beams and associated light sensors. The contour measurement is employed to provide a first estimate of the object geometry needed to compute an electrical parameter image from the acquired charge distribution pattern.
Claims15
A method for producing an image indicative of an electrical characteristic of an object, the steps comprising:
- a) applying a voltage to the surface of the object with an array of sensor elements that make electrical connection with the surface;
- b) measuring the surface charge at each sensor element that results from the applied voltage;
- c) transforming the surface charge measurements;
- d) estimating the electrical characteristics of the object using information indicative of the surface contour of the object;
- e) calculating from the transformed surface charge measurements and estimated electrical characteristics of the object electrical characteristic values throughout the object;
- and
- f) producing an image of the electrical characteristic of the object from said calculated electrical characteristic values.
An apparatus for acquiring electrical property data from an object which comprises:
- a container which defines a cavity for receiving the object;
- an array of metal electrodes supported by the container and disposed around the object;
- an array of light emitting devices supported by the container and operable to produce light beams that extend through the cavity;
- an array of light sensors supported by the container and positioned to receive respective ones of said light beams;
- means responsive to signals produced by the light sensors for determining the contour of the object placed in the cavity;
- means for applying voltages to the array of metal electrodes;
- and
- means for measuring the resulting charge produced at each metal electrode.
Dependencies are inferred from the claim text.