Loading patent…
AssigneeHitachi Software Engineering Co., Ltd.
InventorsTomoyuki Yamamoto, Takuro Tamura
Estimating the term…
The present invention has an objective of obtaining more accurate data of microarray experiments by correcting an inter-pin spotting amount error caused upon microarray production using a plurality of pins. Upon microarray production, samples are immobilized on a microarray support using all pins as controls for correcting the inter-pin spotting amount errors. After the microarray experiments, luminescent intensities of the samples used as control spots for correcting the inter-pin spotting amount errors are measured and used to obtain correction parameters for the inter-pin spotting amount errors of respective pins. These parameters are used to correct luminescent intensities of other samples.
A microarray comprising a support on which a plurality of sample spots are arranged in a two-dimensional array,
A method for producing a microarray having a support on which a plurality of sample spots are arranged in a two-dimensional array, by repeating an operation of simultaneously spotting a plurality of samples on the support by using a spotting device provided with a plurality of pins, wherein the method comprise a step of simultaneously spotting the same samples on the support with all of the pins of the spotting device.
A method for correcting an inter-pin spotting amount error of a microarray produced by repeating an operation of simultaneously spotting a plurality of samples on a support by using a spotting device provided with a plurality of pins, the method comprising the steps of:
Dependencies are inferred from the claim text.